Flaw characterization in conductive media based on pulsed Eddy current measurements: A fast non‐iterative inversion approach
نویسندگان
چکیده
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ژورنال
عنوان ژورنال: IET Science, Measurement & Technology
سال: 2021
ISSN: 1751-8822,1751-8830
DOI: 10.1049/smt2.12027